1.School of Physical Science and Technology, ShanghaiTech University, Shanghai 201210, China;2.State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China;3.Shanghai Engineering Research Center of Energy-Saving Coatings, Shanghai 200083, China;4.Shanghai Key Laboratory of Optical Coatings and Spectral Modulation, Shanghai 200083, China;5.Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China
O43
Supported by National Key R&D Program of China (2021YFA0715500), National Natural Science Foundation of China (NSFC) (12227901), Strategic Priority Research Program (B) of the Chinese Academy of Sciences (XDB0580000), Shanghai Municipal Science and Technology Major Project(2019SHZDZX01) and Chinese Academy of Sciences President''s International Fellowship Initiative (2021PT0007).
SHI Ce, XIE Mao-Bin, ZHENG Wei-Bo, JI Ruo-Nan, WANG Shao-Wei, LU Wei. Study on multi-wavelength thin film thickness determination method[J]. Journal of Infrared and Millimeter Waves,2024,43(6):813~819
Copy