LIU Chao
Integrated Circuit Advanced Process R&D Center, Institute of Microelectronics of the Chinese Academy of Sciences, Beijing 100029, China;University of Chinese Academy of Sciences, Beijing 100049, ChinaHOU Ying
Integrated Circuit Advanced Process R&D Center, Institute of Microelectronics of the Chinese Academy of Sciences, Beijing 100029, China;Wuxi Innovation Center for Internet of Things, Wuxi 214028，ChinaFU Jian-Yu
Integrated Circuit Advanced Process R&D Center, Institute of Microelectronics of the Chinese Academy of Sciences, Beijing 100029, China;University of Chinese Academy of Sciences, Beijing 100049, China;Wuxi Innovation Center for Internet of Things, Wuxi 214028，ChinaLIU Rui-Wen
Integrated Circuit Advanced Process R&D Center, Institute of Microelectronics of the Chinese Academy of Sciences, Beijing 100029, ChinaWEI De-Bo
Integrated Circuit Advanced Process R&D Center, Institute of Microelectronics of the Chinese Academy of Sciences, Beijing 100029, China;University of Chinese Academy of Sciences, Beijing 100049, ChinaCHEN Da-Peng
Integrated Circuit Advanced Process R&D Center, Institute of Microelectronics of the Chinese Academy of Sciences, Beijing 100029, China;University of Chinese Academy of Sciences, Beijing 100049, China;Wuxi Innovation Center for Internet of Things, Wuxi 214028，China1.Integrated Circuit Advanced Process R&D Center, Institute of Microelectronics of the Chinese Academy of Sciences, Beijing 100029, China;2.University of Chinese Academy of Sciences, Beijing 100049, China;3.Wuxi Innovation Center for Internet of Things, Wuxi 214028，China
National Natural Science Foundation of China 61601455 61874137;the Key R&D Program of Beijing Municipal Science and Technology Commission Z191100010618005Supported by National Natural Science Foundation of China (61601455, 61874137)， the Key R&D Program of Beijing Municipal Science and Technology Commission（Z191100010618005）
LIU Chao, HOU Ying, FU Jian-Yu, LIU Rui-Wen, WEI De-Bo, CHEN Da-Peng. An electrical equivalent test method for thermal parameters of a diode type infrared thermal detector[J]. Journal of Infrared and Millimeter Waves,2019,38(6):798~804
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