CRYSTAL STRUCTURE, SURFACE MORPHOLOGY, DEPTH PROFILE OF ELEMENTS AND MID-INFRARED OPTICAL CONSTANTS OF TE-RICH LEAD TELLURIDE FILMS
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TN248.4 O484

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    Abstract:

    The characterizations of Te-rich PbTe layer thermal-evaporated from an excess of Te (<1 mol.%) evaporable materials were reported. The results reveal that the films obtained are polycrystalline and have single-phase NaCl-type PbTe crystal structure. It is also demonstrated that the films have homogeneous surface morphology and homogeneous distribution of Te-rich components along the layer in the range of 170 nm. The study on mid-infrared optical constants of film surface-polished indicates that the influence of surface scattering on optical properties is very small.

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LI Bin, ZHANG Su-Ying, XIE Pin, ZHANG Feng-Shan. CRYSTAL STRUCTURE, SURFACE MORPHOLOGY, DEPTH PROFILE OF ELEMENTS AND MID-INFRARED OPTICAL CONSTANTS OF TE-RICH LEAD TELLURIDE FILMS[J]. Journal of Infrared and Millimeter Waves,2005,24(1):23~26

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  • Revised:June 10,2004
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