ZHANG Su-Ying,FAN Bin,CHENG Shi-Ping,LIN Jie-Hua,ZHOU Shi-Yao,WANG Ge-Ya,SHI Tian-Shen
TN304.25 TN305.055
Microstructures of single layer of telluride and telluride/ZnS multilayer on Si and Ge substrates were investigated by XRD and TEM. The correlation between adhesion and microstructure of layers was given.
ZHANG Su-Ying, FAN Bin, CHENG Shi-Ping, LIN Jie-Hua, ZHOU Shi-Yao, WANG Ge-Ya, SHI Tian-Shen. DEPENDENCE OF ADHESION OF FILMS OF TELLURIDE UPON ITS MI CROSTRUCTURE[J]. Journal of Infrared and Millimeter Waves,1999,18(4):327~331
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