DEPENDENCE OF ADHESION OF FILMS OF TELLURIDE UPON ITS MI CROSTRUCTURE

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DEPENDENCE OF ADHESION OF FILMS OF TELLURIDE UPON ITS MI CROSTRUCTURE
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Clc Number:TN304.25 TN305.055
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Microstructures of single layer of telluride and telluride/ZnS multilayer on Si and Ge substrates were investigated by XRD and TEM. The correlation between adhesion and microstructure of layers was given.

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ZHANG Su-Ying, FAN Bin, CHENG Shi-Ping, LIN Jie-Hua, ZHOU Shi-Yao, WANG Ge-Ya, SHI Tian-Shen. DEPENDENCE OF ADHESION OF FILMS OF TELLURIDE UPON ITS MI CROSTRUCTURE[J]. Journal of Infrared and Millimeter Waves,1999,18(4):327~331

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