SECONDARY ION MASS SPECTROMETRY OF ERBIUM AND OXYGEN CO IMPLANTED IN GaAs
CSTR:
Clc Number:

TN304.23 O482.31

  • Article
  • | |
  • Metrics
  • |
  • Reference
  • |
  • Related
  • |
  • Cited by
  • | |
  • Comments
    Reference
    Related
    Cited by
Get Citation

CHEN Chen Jia LI Hai Tao WANG Xue Zhong. SECONDARY ION MASS SPECTROMETRY OF ERBIUM AND OXYGEN CO IMPLANTED IN GaAs[J]. Journal of Infrared and Millimeter Waves,1997,16(6):413~417

Copy
Share
Article Metrics
  • Abstract:
  • PDF:
  • HTML:
  • Cited by:
History
Article QR Code