1.School of Electronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu 610054, China;2.State Key Laboratory of Complex Electromagnetic Environment Effects on Electronics and Information System (CEMEE), Luoyang 471003, China;3.Department of mechanical and electrical engineering, Nanyang Technician College, Nanyang 473000, China

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the Fundamental Research Funds for the Central Universities ZYGX2018J032;the National Natural Science Foundation of China 61571078 61801088;11505043) and the National Key R&D Program of China 2017YFE0300200 2017YFE0300201Supported by the Fundamental Research Funds for the Central Universities (ZYGX2018J032), the National Natural Science Foundation of China (61571078, 61801088, 11505043) and the National Key R&D Program of China (2017YFE0300200, 2017YFE0300201).