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The effect of Nd doping on microstructure and electrical properties of BiFeO3 thin films
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National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of,Key Laboratory for Polar Materials and Devices of Ministry of Education, East China Normal University, Shanghai,National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of,Key Laboratory for Polar Materials and Devices of Ministry of Education, East China Normal University,National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of,National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of,National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of

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    Abstract:

    The Nd doped BiFeO3 thin films are prepared on LaNiO3/Si (100) substrate by chemical solution deposition method. The results of x-ray diffraction show that the lattice constant of thin films decreases with the increase of Nd content. The impurity phases are found in the thin film with 20% Nd content. The results of dielectric measurement indicate that the dielectric constant and loss of thin films decrease with the increase of Nd content. A very strong dielectric frequency dispersion and relaxation of dielectric loss peak occurs in the thin film with 2% Nd content and it follows Debye-like law. The leakage current of thin films decreases with the increase of Nd content. The current transport follows SCLC model in low electric field region and follows Poole-Frenkel model in high electric field region. These results suggest that Nd doping has a strong influence on microstructure and electric properties of BiFeO3 thin films.

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GAO Cheng, YANG Jing, MENG Xiang-Jian, BAI Wei, LIN Tie, SUN Jing-Lan, CHU Jun-Hao. The effect of Nd doping on microstructure and electrical properties of BiFeO3 thin films[J]. Journal of Infrared and Millimeter Waves,2012,31(1):21~25

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History
  • Received:October 28,2010
  • Revised:November 08,2010
  • Adopted:November 09,2010
  • Online: February 28,2012
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